Toshikazu Kuwano

Inventor

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Work History

Patent OwnerApplications FiledYear
SEIKO EPSON CORPORATION
2
2
1
2
2
2
1999
2002
2004
2010
2012
2014

Inventor Addresses

AddressDuration
Chino, JPJun 07, 05 - Mar 07, 06
Chino-shi, JPNov 14, 02 - Nov 14, 02
FUJIMI-MACHI, JPAug 29, 19 - Aug 29, 19
Fujimi-machi, JPMay 26, 11 - Oct 06, 20
NEYAGAWA-SHI, JPAug 01, 02 - Aug 01, 02
Neyagawa, JPMay 27, 03 - May 27, 03

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 1
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1
G01F: MEASURING VOLUME, VOLUME FLOW, MASS FLOW, OR LIQUID LEVEL; METERING BY VOLUME 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
107976432020Oscillation circuit, microcomputer and electronic device1
107565302020Overcurrent detection circuit, semiconductor apparatus, and power supply apparatus0
107142432020Variable resistance circuit, oscillator circuit, and semiconductor device0
107151282020Power supply voltage detection circuit, semiconductor apparatus and electronic device0
2019/0267,9802019POWER SUPPLY VOLTAGE DETECTION CIRCUIT, SEMICONDUCTOR APPARATUS AND ELECTRONIC DEVICE1

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