Roy Kutlik

Inventor

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Work History

Patent OwnerApplications FiledYear
CHEVRON U.S.A. INC.
1
2
2000
2015
SILIXA LTD.
2
2015
Sensor Dynamics, Limited
1
2000

Inventor Addresses

AddressDuration
Oakland, CAJul 27, 04 - Jul 27, 04
Oakland, CA, USSep 03, 15 - Nov 28, 17

Technology Profile

Technology Matters
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1
G01F: MEASURING VOLUME, VOLUME FLOW, MASS FLOW, OR LIQUID LEVEL; METERING BY VOLUME 1
G01H: MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
98293682017Industrial process monitoring and imaging16
2015/0247,7512015INDUSTRIAL PROCESS MONITORING AND IMAGING17
67667032004Apparatus and method for enhancing remote sensor performance and utility21

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