Weitian KOU
Inventor
Stats
- 0 US patents issued
- 14 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 0 US Patents Issued
- 14 US Applications Filed
- 37 Total Citation Count
- Jan 24, 2023 Most Recent Filing
- Sep 21, 2016 Earliest Filing
Work History
No Work History Available.Inventor Addresses
Address | Duration |
---|---|
Eindhoven, NL | Mar 28, 19 - Oct 22, 24 |
Technology Profile
Technology | Matters | |
---|---|---|
G03F: | PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR | 13 |
G05B: | CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS | 3 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
12124179 | 2024 | Method of wafer alignment using at resolution metrology on product features | 0 |
12044981 | 2024 | Method and apparatus for optimization of lithographic process | 0 |
11782349 | 2023 | Methods of determining corrections for a patterning process, device manufacturing method, control system for a lithographic apparatus and lithographic apparatus | 0 |
2023/0168,594 | 2023 | METHOD OF WAFER ALIGNMENT USING AT RESOLUTION METROLOGY ON PRODUCT FEATURES | 0 |
2023/0168,591 | 2023 | METHODS OF DETERMINING CORRECTIONS FOR A PATTERNING PROCESS, DEVICE MANUFACTURING METHOD, CONTROL SYSTEM FOR A LITHOGRAPHIC APPARATUS AND LITHOGRAPHIC APPARATUS | 0 |
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