Toshiya Kotani

Inventor

Add to Portfolio

Stats

Details

Work History

Patent OwnerApplications FiledYear
KABUBHSIKI KAISHA TOSHIBA
1
2011
KABUSHIKI KAISHA TOSHIBA
1
2
2
2
5
4
14
20
12
6
10
19
17
4
4
4
1
2
1998
1999
2000
2001
2002
2003
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
2014
2015
TOSHIBA MEMORY CORPORATION
1
4
2
7
6
4
1
10
10
3
16
10
4
5
2
2
1999
2002
2003
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
2014
2015
2016

Inventor Addresses

AddressDuration
Kanagawa-ken, JPJul 03, 03 - Jun 20, 06
Machida, JPAug 15, 06 - Apr 24, 18
Machida-shi, JPJul 29, 04 - Nov 24, 16
Sagamihara, JPJan 30, 01 - Sep 11, 12
Sagamihara-shi, JPJun 28, 01 - Sep 01, 05
TOKYO, JPJul 03, 14 - Jul 03, 14
Tokyo, JPApr 14, 05 - May 22, 18

Technology Profile

Technology Matters
B05C: APPARATUS FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL 1
B41J: TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS 1
B81C: PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICRO-STRUCTURAL DEVICES OR SYSTEMS 1

See more…

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
99778552018Method of wiring layout, semiconductor device, program for supporting design of wiring layout, and method for manufacturing semiconductor device1
99531262018Method of wiring layout, semiconductor device, program for supporting design of wiring layout, and method for manufacturing semiconductor device2
99170492018Semiconductor device having contacts in drawing area and the contacts connected to word lines extending from element formation area0
96981572017Microstructure device and method for manufacturing the same0
95761002017Pattern data generation method, pattern verification method, and optical image calculation method0

See more…


We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
> Upgrade to our Level for up to -1 portfolios!.