Shogo Kosuge
Inventor
Stats
- 4 US patents issued
- 5 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 4 US Patents Issued
- 5 US Applications Filed
- 39 Total Citation Count
- Nov 19, 2003 Most Recent Filing
- Mar 14, 2000 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| V TECHNOLOGY CO., LTD. | 1
2 | 2000
2003 |
| HITACHI KOKUSAI ELECTRIC INC. | 2
2 1 | 2000
2002 2003 |
Inventor Addresses
| Address | Duration |
|---|---|
| Tachikawa, JP | May 31, 01 - Mar 15, 05 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 3 |
| G01C: | MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY | 1 |
| G01P: | MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 6868354 | 2005 | Method of detecting a pattern and an apparatus thereof | 5 |
| 2004/0111,230 | 2004 | Method of detecting a pattern and an apparatus thereof | 2 |
| 6680781 | 2004 | Critical dimension measurement method and apparatus capable of measurement below the resolution of an optical microscope | 1 |
| 2004/0008,352 | 2004 | Precision size measuring apparatus | 3 |
| 6571196 | 2003 | Size inspection/measurement method and size inspection/measurement apparatus | 4 |
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