Alexander Prasetya Konijnenberg
Inventor
Stats
- 0 US patents issued
- 7 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 0 US Patents Issued
- 7 US Applications Filed
- 6 Total Citation Count
- Feb 17, 2022 Most Recent Filing
- Mar 3, 2017 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| ASML NETHERLANDS B.V. | 1
| 2017
|
Inventor Addresses
| Address | Duration |
|---|---|
| Eindhoven, NL | Sep 22, 22 - Dec 10, 24 |
| Rotterdam, NL | Sep 14, 17 - Mar 19, 19 |
| Veldhoven, NL | Sep 22, 22 - Oct 15, 24 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 2 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 5 |
| G02B: | OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 12164233 | 2024 | Metrology method and apparatus for of determining a complex-valued field | 0 |
| 12117734 | 2024 | Metrology method and device for determining a complex-valued field | 0 |
| 2024/0152,060 | 2024 | METHOD AND SYSTEM FOR PREDICTING PROCESS INFORMATION WITH A PARAMETERIZED MODEL | 0 |
| 2024/0004,313 | 2024 | METHOD AND APPARATUS FOR IMAGING NONSTATIONARY OBJECT | 0 |
| 2023/0064,193 | 2023 | METROLOGY METHOD AND DEVICE FOR MEASURING A PERIODIC STRUCTURE ON A SUBSTRATE | 1 |
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