Hideaki Koizumi

Inventor

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Work History

Patent OwnerApplications FiledYear
Hitachi Naka Seiki Kabushiki Kaisha
1
1981
JAPAN SCIENCE AND TECHNOLOGY AGENCY
1
2001
HITACHI, LTD.
1
3
2
1
2
1
2
1
1
1
4
1
7
3
7
8
14
2
2
5
2
2
4
1
1
1977
1981
1982
1983
1984
1987
1988
1989
1991
1992
1995
1996
1997
1998
1999
2000
2001
2002
2003
2005
2006
2008
2012
2013
2014
KAO CORPORATION
1
1
1
1991
1992
1993
MITSUBISHI DENKI KABUSHIKI KAISHA
1
1
1
2
1994
1995
1996
1997
MAKOR ISSUES AND RIGHTS LTD.
1
2000
Sato Knowledge and Intellectual Property Institute
2
2007
KABUSHIKI KAISHA SATO
4
2007
HITACHI MEDICAL CORPORATION
1
2
4
2
11
2
4
1
1
2
2
1
1985
1986
1987
1988
1989
1990
1991
1992
1999
2000
2001
2002

Inventor Addresses

AddressDuration
Katsuta, JPMay 13, 80 - Feb 21, 95
Setagaya-ku, JPSep 19, 00 - Aug 20, 02
Shizuoka, JPDec 24, 96 - Nov 24, 98
Tokyo, JPMar 22, 83 - Sep 11, 18

Technology Profile

Technology Matters
A61B: DIAGNOSIS; SURGERY; IDENTIFICATION 39
A61K: PREPARATIONS FOR MEDICAL, DENTAL, OR TOILET PURPOSES 2
B01D: SEPARATION 8

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
100731162018Scanning probe microscope and its sample holder0
2017/0343,5802017SCANNING PROBE MICROSCOPE AND SAMPLE HOLDER THEREFOR1
94234162016Scanning probe microscope and measuring method using same1
2015/0192,6042015HOLDER FOR PROBE MICROSCOPE, PROBE MICROSCOPE AND SPECIMEN MEASUREMENT METHOD3
2015/0177,2752015SCANNING PROBE MICROSCOPE AND MEASURING METHOD USING SAME1

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