Yuji Kohno
Inventor
Stats
- 7 US patents issued
- 21 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 7 US Patents Issued
- 21 US Applications Filed
- 30 Total Citation Count
- Oct 30, 2023 Most Recent Filing
- Dec 2, 1991 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| JEOL LTD. | 2
2 8 1 | 2013
2015 2016 2017 |
| SHINDENGEN ELECTRIC MANUFACTURING CO., LTD. | 1
| 1991
|
| THE UNIVERSITY OF TOKYO | 2
| 2016
|
| YAMANASHI ELECTRONICS CO., LTD. | 1
| 1991
|
Inventor Addresses
| Address | Duration |
|---|---|
| Kofu, JP | Jan 19, 93 - Jan 19, 93 |
| Tokyo, JP | Dec 12, 13 - May 02, 24 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 2 |
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 2 |
| G03G: | ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2024/0145,211 | 2024 | Method of Adjusting Charged Particle Optical System and Charged Particle Beam Apparatus | 0 |
| 2023/0349,839 | 2023 | Electron Microscope and Aberration Measurement Method | 0 |
| 2023/0127,255 | 2023 | Electron Microscope and Image Acquisition Method | 0 |
| 11508550 | 2022 | Method and apparatus for image processing | 0 |
| 11462384 | 2022 | Method of acquiring dark-field image | 0 |
We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
>
Upgrade to our Level for up to -1 portfolios!.