Hisayuki Kohno
Inventor
Stats
- 4 US patents issued
- 6 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 4 US Patents Issued
- 6 US Applications Filed
- 99 Total Citation Count
- Nov 24, 2006 Most Recent Filing
- Dec 7, 1999 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| RIGAKU CORPORATION | 1
6 | 1999
2006 |
| RIGAKU INDUSTRIAL CORPORATION | 1
1 | 2003
2004 |
Inventor Addresses
| Address | Duration |
|---|---|
| OSAKA, JP | Jul 13, 06 - Jul 13, 06 |
| Osaka, JP | Jul 31, 03 - May 07, 09 |
| Takatsuki, JP | May 29, 01 - May 24, 11 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 1 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 4 |
| G01T: | MEASUREMENT OF NUCLEAR OR X-RADIATION | 3 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 7949093 | 2011 | X-ray fluorescence spectrometer | 3 |
| 2009/0116,613 | 2009 | X-RAY FLUORESCENCE SPECTROMETER | 9 |
| 7450685 | 2008 | X-ray fluorescence spectrometer and program for use therewith | 6 |
| 7356114 | 2008 | X-ray fluorescence spectrometer | 10 |
| 2007/0086,567 | 2007 | X-ray fluorescence spectrometer and program for use therewith | 6 |
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