Chun-Yao Ko
Inventor
Stats
- 23 US patents issued
- 40 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 23 US Patents Issued
- 40 US Applications Filed
- 159 Total Citation Count
- Dec 11, 2023 Most Recent Filing
- Jul 4, 2006 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., ("TSMC") | 1
| 2010
|
| TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. | 5
4 4 4 2 13 3 4 1 | 2007
2010 2011 2012 2013 2014 2015 2016 2017 |
| UNITED MICROELECTRONICS CORP. | 2
2 | 2006
2010 |
Inventor Addresses
| Address | Duration |
|---|---|
| Bade City, TW | May 08, 08 - Jun 09, 11 |
| Bade, TW | Jun 17, 08 - Mar 11, 14 |
| HSINCHU CITY, TW | May 04, 17 - Jan 09, 25 |
| Hsin-Chu, TW | Oct 03, 13 - Dec 05, 17 |
| Hsinchu City, TW | Oct 11, 12 - Aug 01, 24 |
| Hsinchu, TW | Feb 18, 14 - Dec 12, 23 |
| Taichung City, TW | Apr 06, 23 - Apr 06, 23 |
| Taichung, TW | Nov 15, 22 - Sep 17, 24 |
| Taoyuan County, TW | Jan 17, 08 - Mar 13, 12 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 3 |
| G06F: | ELECTRIC DIGITAL DATA PROCESSING | 1 |
| G06Q: | DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTING PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTING PURPOSES, NOT OTHERWISE PROVIDED FOR | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2025/0017,004 | 2025 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | 0 |
| 12092700 | 2024 | Interactive test equipment for quality evaluation of resistance value test for electric leakage | 0 |
| 2024/0257,874 | 2024 | NON-VOLATILE MEMORY CELL STRUCTURES AND METHODS OF MANUFACTURING THEREOF | 0 |
| 2024/0107,755 | 2024 | NON-VOLATILE MEMORY (NVM) CELL STRUCTURE TO INCREASE RELIABILITY | 0 |
| 11844213 | 2023 | Non-volatile memory (NVM) cell structure to increase reliability | 0 |
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