Takefumi Kiwada

Inventor

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Work History

Patent OwnerApplications FiledYear
MITUTOYO CORPORATION
2
2
4
1
2
3
2005
2007
2008
2010
2012
2015

Inventor Addresses

AddressDuration
Gifu, JPNov 19, 24 - Nov 19, 24
Kawasaki, JPMar 10, 09 - Aug 25, 09
Kawasaki-shi, JPMay 29, 08 - May 29, 08
Minamikiso-machi, JPOct 08, 15 - Oct 24, 17
Nagiso-machi, JPJun 14, 22 - Jun 14, 22
Nakatsugawa, JPSep 05, 06 - Nov 25, 21
Nakatsugawa-shi, JPAug 04, 05 - Mar 03, 16

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 6
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 2
G01L: MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
121482862024Precision length measuring device0
D9545782022Display plate for measurement1
2021/0366,2462021MEASURING DEVICE0
103172022019Parameter setting method of measuring instrument and computer readable medium0
97984452017Measuring instrument0

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