Janos Kirz

Inventor

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Work History

Patent OwnerApplications FiledYear
SIGRAY, INC.
7
8
9
3
2014
2015
2016
2017

Inventor Addresses

AddressDuration
Berkeley, CA, USApr 02, 15 - Jan 28, 25

Technology Profile

Technology Matters
A61B: DIAGNOSIS; SURGERY; IDENTIFICATION 11
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 2
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 35

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
122099772025X-ray detector system with at least two stacked flat Bragg diffractors0
2025/0027,8892025HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY SOURCE0
2024/0393,2662024HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY SOURCE0
121530012024High throughput 3D x-ray imaging system using a transmission x-ray source0
2024/0280,5152024X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS1

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