Tae-Ik Kim

Inventor

Add to Portfolio

Stats

Details

Work History

Patent OwnerApplications FiledYear
SAMSUNG DISPLAY CO., LTD.
2
2
1
2013
2015
2017
SAMSUNG ELECTRONICS CO., LTD.
4
4
3
1
2014
2015
2016
2017

Inventor Addresses

AddressDuration
SEONGNAM-SI, KRMay 31, 18 - Nov 14, 19
Seongnam-Si, KRMar 02, 17 - Mar 02, 17
Seongnam-si, KRMar 05, 15 - Oct 20, 20
Yongin, KRFeb 14, 17 - Feb 28, 17
Yongin-City, KRDec 12, 13 - Jul 23, 15
Yongin-si, KRJun 01, 17 - Apr 24, 18

Technology Profile

Technology Matters
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 3
G05F: SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES 2
G06F: ELECTRIC DIGITAL DATA PROCESSING 3

See more…

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
108120542020Digitally-controlled oscillators having current mirrors and negative-feedback circuits therein that support high power supply rejection ratio (PSRR) and low noise characteristics1
106131412020Method of measuring clock jitter, clock jitter measurement circuit, and semiconductor devices including the same0
2020/0021,2782020DIGITALLY-CONTROLLED OSCILLATORS HAVING CURRENT MIRRORS AND NEGATIVE-FEEDBACK CIRCUITS THEREIN THAT SUPPORT HIGH POWER SUPPLY REJECTION RATIO (PSRR) AND LOW NOISE CHARACTERISTICS0
2019/0346,5042019METHOD OF MEASURING CLOCK JITTER, CLOCK JITTER MEASUREMENT CIRCUIT, AND SEMICONDUCTOR DEVICES INCLUDING THE SAME1
103597932019Method and circuit for controlling oscillator and apparatus employing the same1

See more…


We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
> Upgrade to our Level for up to -1 portfolios!.