Sangtaek Kim

Inventor

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Work History

Patent OwnerApplications FiledYear
Neonode Inc.
2
2016

Inventor Addresses

AddressDuration
Dublin, CA, USFeb 13, 20 - Jan 14, 25
San Jose, CA, USFeb 11, 21 - Feb 11, 21
Walnut Creek, CA, USJun 02, 16 - Oct 13, 22

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 1
G02B: OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 2
G06F: ELECTRIC DIGITAL DATA PROCESSING 5

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
121969442025Imaging system for leak detection0
2022/0326,7832022CONTACTLESS CONTROL PANEL0
113790482022Contactless control panel0
111435032021Interferometric waviness detection systems0
2021/0215,9252021IMAGING SYSTEM FOR LEAK DETECTION23

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