Chung Hwan Kim

Inventor

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Work History

Patent OwnerApplications FiledYear
TEXTRON INC.
1
2010
NEC CORPORATION
2
2014
Technology Tree Co., LTD
1
2000
TECHNOLGOGY TREE CO., LTD.
1
2002
MTEKVISION CO., LTD.
1
1
1998
1999
Telecommunication & Electronics Inc.
3
2008
KOREA INSTITUTE OF MACHINERY & MATERIALS
1
2
2008
2010
LEE, KI-NAM
2
2010

Inventor Addresses

AddressDuration
Daejeon, KRJun 27, 00 - Jul 21, 11
FRANKLIN PARK, NJ, USMar 18, 21 - Mar 18, 21
Franklin Park, NJ, USFeb 07, 23 - Feb 07, 23
Pennington, NJ, USApr 04, 19 - Aug 23, 22
SEOUL, KRFeb 05, 09 - Feb 05, 09
Seoul, KRSep 17, 02 - Feb 03, 15
Sungnam city, KRJul 31, 03 - Jul 31, 03
Suwon-si, KRJun 20, 24 - Jul 04, 24
Taejon, KROct 29, 02 - Oct 29, 02
Ulsan, KRNov 17, 22 - Nov 23, 23
West Lafayette, IN, USApr 16, 15 - Jun 14, 16

Technology Profile

Technology Matters
A61B: DIAGNOSIS; SURGERY; IDENTIFICATION 1
B01F: MIXING, e.g. DISSOLVING, EMULSIFYING, DISPERSING 1
B22C: FOUNDRY MOULDING 2

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2024/0222,0202024MULTILAYER ELECTRONIC COMPONENT0
2024/0203,6522024MULTILAYER ELECTRONIC COMPONENT0
2023/0372,9962023INSPECTION CUP FOR INSPECTING IMPURITY IN MOLTEN METAL FOR DIE CASTING AND METHOD OF INSPECTING IMPURITY IN MOLTEN METAL FOR DIE CASTING USING INSPECTION CUP0
115738282023Efficient and scalable enclave protection for machine learning programs1
2022/0362,8362022INSPECTION CUP FOR INSPECTING IMPURITY IN MOLTEN METAL FOR DIE CASTING AND METHOD OF INSPECTING IMPURITY IN MOLTEN METAL FOR DIE CASTING USING INSPECTION CUP0

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