Jay Keck

Inventor

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Work History

Patent OwnerApplications FiledYear
ADE Corporation
5
2005
KLA-TENCOR TECHNOLOGIES CORPORATION
2
2005

Inventor Addresses

AddressDuration
Portland, ORJan 12, 06 - Mar 18, 08
Portland, OR, USJan 12, 06 - Jan 12, 06

Technology Profile

Technology Matters
G01M: TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR 2
G06F: ELECTRIC DIGITAL DATA PROCESSING 2

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
73468832008System and method for integrated data transfer, archiving and purging of semiconductor wafer data13
73435832008System and method for searching for patterns of semiconductor wafer features in semiconductor wafer data12
2006/0010,4162006System and method for searching for patterns of semiconductor wafer features in semiconductor wafer data29
2006/0009,9432006Method and system for managing, analyzing and automating data in the production of semiconductor wafers and for monitoring the production process25
2006/0009,9422006System and method for integrated data transfer, archiving and purging of semiconductor wafer data18

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