Mustafa N Kaynak
Inventor
Stats
- 21 US patents issued
- 162 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 21 US Patents Issued
- 162 US Applications Filed
- 412 Total Citation Count
- Dec 10, 2024 Most Recent Filing
- Dec 16, 2009 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| STMICROELECTRONICS, INC. | 2
5 | 2009
2010 |
| STMICROELECTRONICS S.R.L. | 1
| 2010
|
| MICRON TECHNOLOGY, INC. | 6
8 2 15 6 | 2012
2013 2014 2015 2016 |
Inventor Addresses
| Address | Duration |
|---|---|
| SAN DIEGO, CA, US | Sep 12, 19 - Sep 12, 19 |
| San Deigo, CA, US | Jun 05, 14 - Dec 05, 23 |
| San Diego, CA, US | Mar 31, 11 - Apr 03, 25 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| C09K: | MATERIALS FOR APPLICATIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR | 1 |
| G03F: | PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR | 1 |
| G06F: | ELECTRIC DIGITAL DATA PROCESSING | 118 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2025/0110,658 | 2025 | DYNAMIC BIT FLIP THRESHOLDS BASED ON SOFT BIT AND MATCH BIT | 0 |
| 12266420 | 2025 | Temperature-compensated time estimate for a block to reach a uniform charge loss state | 0 |
| 2025/0103,218 | 2025 | MANAGING ERROR COMPENSATION USING CHARGE COUPLING AND LATERAL MIGRATION SENSITIVITY | 0 |
| 12229000 | 2025 | Managing error-handling flows in memory devices | 0 |
| 12223190 | 2025 | Measurement of representative charge loss in a block to determine charge loss state | 0 |
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