Peter G Kaup

Inventor

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Work History

Patent OwnerApplications FiledYear
LOCKHEED MARTIN CORPORATION
2
1
1
11
5
2008
2012
2015
2016
2017

Inventor Addresses

AddressDuration
Bethesda, MD, USJan 11, 18 - Nov 17, 20
MARLTON, NJ, USAug 11, 16 - Aug 11, 16
Marlton, NJ, USMay 20, 10 - Nov 30, 21

Technology Profile

Technology Matters
B64C: AEROPLANES; HELICOPTERS 2
G01C: MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY 3
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
111877652021Apparatus and method for lower magnetometer drift with increased accuracy0
108380212020Apparatus and method for simultaneous ramsey vector magnetometry0
108166162020Phase shifted magnetometry adaptive cancellation4
107251242020DNV magnetic field detector2
106779532020Magneto-optical detecting apparatus and methods16

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