Toshihiro Katashita
Inventor
Stats
- 4 US patents issued
- 7 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 4 US Patents Issued
- 7 US Applications Filed
- 250 Total Citation Count
- Aug 3, 2016 Most Recent Filing
- Mar 7, 2006 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY (SHARE 50%) | 2
| 2006
|
| NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY (75%) | 2
| 2006
|
| DUAXES CORPORATION (SHARE 25%) | 2
| 2006
|
| BITS CO., LTD. | 3
| 2006
|
| BITS CO., LTD. (SHARE 25%) | 2
| 2006
|
| NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY | 3
1 2 1 | 2006
2012 2013 2015 |
Inventor Addresses
| Address | Duration |
|---|---|
| Tsukuba, JP | Nov 30, 10 - Apr 28, 20 |
| Tsukuba-shi, Ibaraki, JP | Sep 07, 17 - Jan 17, 19 |
| Tsukuba-shi, JP | Mar 22, 07 - May 23, 13 |
| c/o National Institute of Advanced Indust. Science and Technology Tsukuba Central 2, 1-1-1 Umezono | Sep 15, 09 - Sep 15, 09 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 2 |
| G06F: | ELECTRIC DIGITAL DATA PROCESSING | 5 |
| G09C: | CIPHERING OR DECIPHERING APPARATUS FOR CRYPTOGRAPHIC OR OTHER PURPOSES INVOLVING THE NEED FOR SECRECY | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 10636751 | 2020 | Semiconductor device including circuit having security function | 0 |
| 10402248 | 2019 | Method for controlling error rate of device-specific information and program for controlling error rate of device-specific information | 0 |
| 2019/0019,766 | 2019 | SEMICONDUCTOR DEVICE INCLUDING CIRCUIT HAVING SECURITY FUNCTION | 2 |
| 2017/0255,503 | 2017 | METHOD FOR CONTROLLING ERROR RATE OF DEVICE-SPECIFIC INFORMATION AND PROGRAM FOR CONTROLLING ERROR RATE OF DEVICE-SPECIFIC INFORMATION | 2 |
| 9121873 | 2015 | Electronic circuit component authenticity determination method | 5 |
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