Keiji Kashima

Inventor

Add to Portfolio

Stats

Details

Work History

Patent OwnerApplications FiledYear
DAI NIPPON PRINTING CO., LTD.
7
6
3
3
19
18
5
6
10
10
5
2
10
4
11
2
1
2
2
1998
1999
2000
2001
2002
2003
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
2014
2015
2016
KABUSHIKI KAISHA TOSHIBA
2
2005
TOSOH CORPORATION
1
3
1
2
3
1
1991
1992
1993
1994
1995
1996

Inventor Addresses

AddressDuration
Ebina, JPMar 24, 98 - Mar 24, 98
Higashimurayama, JPApr 24, 07 - Apr 24, 07
Higashimurayama-shi, JPFeb 16, 06 - Feb 16, 06
Kanagawa, JPMar 03, 92 - Jul 15, 97
Saitama, JPApr 08, 97 - Apr 07, 98
Shinjuku, JPJan 03, 08 - Jan 03, 08
Shinjuku-Ku Tokyo, JPMay 15, 03 - May 15, 03
Shinjuku-Ku, JPJul 10, 01 - Apr 15, 08
Shinjuku-ku, JPNov 30, 99 - Feb 25, 14
TOKYO, JPOct 18, 01 - Jan 31, 02
Tokorozawa, JPJan 24, 17 - Jan 12, 21
Tokorozawa-Shi, JPAug 26, 10 - Dec 13, 18
Tokyo, JPNov 14, 00 - Nov 28, 24
Tokyo-To, JPDec 05, 02 - Apr 01, 08
Tokyo-to, JPJul 08, 04 - Jun 18, 15
Toyko, JPSep 04, 03 - Mar 11, 08

Technology Profile

Technology Matters
B05D: PROCESSES FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL 4
B23P: OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS 1
B29C: SHAPING OR JOINING OF PLASTICS; SHAPING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL; AFTER- TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING 1

See more…

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2024/0393,6912024MARKER, METHOD FOR MANUFACTURING MARKER, AND DETECTION TARGET0
2024/0346,6872024MEASURING SYSTEM0
2023/0068,5812023MARKER, METHOD FOR MANUFACTURING MARKER, AND DETECTION TARGET0
108907772021Electromagnetic wave reflecting member0
2018/0356,6442018ELECTROMAGNETIC WAVE REFLECTING MEMBER1

See more…


We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
> Upgrade to our Level for up to -1 portfolios!.