Kimio Kanda
Inventor
Stats
- 7 US patents issued
- 7 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 7 US Patents Issued
- 7 US Applications Filed
- 91 Total Citation Count
- Dec 19, 2001 Most Recent Filing
- Jul 26, 1979 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| TOHOKU ELECTRIC POWER CO., INC. | 1
| 1979
|
| HITACHI, LTD. | 2
2 1 1 2 | 1979
1990 1998 1999 2001 |
| CHUBU ELECTRIC POWER CO., INC. | 1
| 1979
|
| BABCOCK-HITACHI K.K. | 1
| 1979
|
| THE CHUGOKU ELECTRIC POWER CO., INC. | 1
| 1979
|
| TOKYO ELECTRIC POWER CO., INC. | 1
| 1979
|
Inventor Addresses
| Address | Duration |
|---|---|
| Hitachi, JP | Jul 21, 81 - May 25, 82 |
| Hitachi-naka, JP | Nov 26, 02 - Nov 26, 02 |
| Hitachinaka, JP | Sep 19, 00 - Nov 25, 03 |
| Katsuta, JP | Jul 16, 91 - Nov 12, 91 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 1 |
| G01K: | MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR | 2 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 2 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 6653637 | 2003 | X-ray detector and charged-particle apparatus | 5 |
| 6486476 | 2002 | Semiconductor radiation detector and manufacture thereof | 11 |
| 2002/0100,877 | 2002 | X-ray detector and charged-patricle apparatus | 5 |
| 6121623 | 2000 | Parallel radiation detector | 1 |
| 5065020 | 1991 | Energy dispersive X-ray spectrometer | 15 |
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