Kazuya Kudo
Inventor
Stats
- 3 US patents issued
- 4 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 3 US Patents Issued
- 4 US Applications Filed
- 60 Total Citation Count
- Sep 12, 2023 Most Recent Filing
- Oct 8, 1991 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| ADVANCED DATA SERVICES, INC. | 1
| 1999
|
| RENESAS ELECTRONICS CORPORATION | 1
2 | 1999
2007 |
| NIPPON STEEL CORPORATION | 1
| 1991
|
Inventor Addresses
| Address | Duration |
|---|---|
| Kanagawa, JP | Apr 09, 02 - Apr 13, 10 |
| Kitakyushi, JP | Jan 05, 93 - Jan 05, 93 |
| Koshi City, JP | Mar 21, 24 - Mar 21, 24 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| B22D: | CASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES | 1 |
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 2 |
| G03F: | PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2024/0094,644 | 2024 | SUBSTRATE TREATMENT APPARATUS AND TREATMENT SOLUTION SUPPLY METHOD | 0 |
| 7698613 | 2010 | Semiconductor integrated circuit device and method of testing same | 7 |
| 2007/0226,565 | 2007 | SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND METHOD OF TESTING SAME | 5 |
| 6370663 | 2002 | Semiconductor integrated circuit | 4 |
| 5176197 | 1993 | Continuous caster mold and continuous casting process | 28 |
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