Shotaro Kobayashi

Inventor

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Work History

Patent OwnerApplications FiledYear
LONGITUDE SEMICONDUCTOR S.A.R.L.
1
1
2
2
2
8
6
4
2
1
1999
2000
2001
2004
2005
2006
2008
2010
2011
2013
PENTAX CORPORATION
2
2
2006
2007
ELPIDA MEMORY, INC.
2
1
1
1
1991
1993
2008
2009
NEC ELECTRONICS CORPORATION
1
1996
HOYA CORPORATION
4
1
1
5
1
1
2006
2008
2009
2010
2011
2013
MICRON TECHNOLOGY, INC.
2
2010
PS4 LUXCO S.A.R.L.
2
1
1994
1996

Inventor Addresses

AddressDuration
Chuo-ku, JPDec 03, 09 - Mar 22, 11
Saitama, JPApr 26, 07 - May 27, 14
Toko, JPJan 20, 11 - Sep 09, 14
Tokyo, JPAug 10, 93 - May 23, 19

Technology Profile

Technology Matters
A61B: DIAGNOSIS; SURGERY; IDENTIFICATION 12
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 2
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2019/0150,7902019ENDOSCOPE SYSTEM0
2018/0235,4452018ENDOSCOPE PROCESSOR AND ENDOSCOPE CONNECTION SYSTEM1
2014/0323,8782014SCANNING PROBE, SCANNING OBSERVATION SYSTEM, INTEGRATED ENDOSCOPE, AND INTEGRATED ENDOSCOPE SYSTEM12
88484682014Semiconductor device and control method thereof for permitting the reception of data according to a control signal1
88317102014Medical observation system and processor4

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