Kosuke Kawakyu
Inventor
Stats
- 1 US patents issued
- 3 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 1 US Patents Issued
- 3 US Applications Filed
- 27 Total Citation Count
- Sep 3, 2019 Most Recent Filing
- Apr 3, 2012 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| RIGAKU CORPORATION | 2
1 | 2012
2014 |
Inventor Addresses
| Address | Duration |
|---|---|
| Takatsuki, JP | Jul 08, 14 - Feb 16, 21 |
| Takatsuki-shi, JP | Nov 07, 13 - Jan 02, 20 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01D: | MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR | 1 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 2 |
| G01T: | MEASUREMENT OF NUCLEAR OR X-RADIATION | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 10921267 | 2021 | X-ray fluorescence analysis method, X-ray fluorescence analysis program, and X-ray fluorescence spectrometer | 1 |
| 2020/0003,712 | 2020 | X-RAY FLUORESCENCE ANALYSIS METHOD, X-RAY FLUORESCENCE ANALYSIS PROGRAM, AND X-RAY FLUORESCENCE SPECTROMETER | 19 |
| 2014/0284,478 | 2014 | X-RAY ANALYZING APPARATUS | 5 |
| 8774356 | 2014 | Wavelength dispersive X-ray fluorescence spectrometer | 2 |
| 2013/0294,577 | 2013 | WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER | 3 |
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