Chu-Shik Kang
Inventor
Stats
- 5 US patents issued
- 6 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 5 US Patents Issued
- 6 US Applications Filed
- 23 Total Citation Count
- Nov 13, 2014 Most Recent Filing
- Aug 19, 2008 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE | 4
2 5 | 2008
2011 2014 |
| KOREA ESEARCH INSTITUTE OF STANDARDS AND SCIENCE | 2
| 2014
|
Inventor Addresses
| Address | Duration |
|---|---|
| Daejeon, KR | Jul 15, 10 - Mar 20, 18 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 4 |
| G01D: | MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR | 1 |
| G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 9921051 | 2018 | Thickness measuring apparatus and thickness measuring method | 0 |
| 9651403 | 2017 | Absolute position measurement method, absolute position measurement apparatus and scale | 1 |
| 9121696 | 2015 | Device and method for measuring via hole of silicon wafer | 2 |
| 2015/0069,225 | 2015 | ABSOLUTE POSITION MEASUREMENT METHOD, ABSOLUTE POSITION MEASUREMENT APPARATUS AND SCALE | 3 |
| 2015/0012,246 | 2015 | THICKNESS MEASURING APPARATUS AND THICKNESS MEASURING METHOD | 2 |
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