Woo Sik Jung
Inventor
Stats
- 2 US patents issued
- 4 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 2 US Patents Issued
- 4 US Applications Filed
- 4 Total Citation Count
- Mar 1, 2023 Most Recent Filing
- Jan 20, 2009 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| SK HYNIX INC. | 3
| 2015
|
| KOREA ATOMIC ENERGY RESEARCH INSTITUTE | 2
| 2009
|
| UNITEST INC. | 3
| 2015
|
| KOREA HYDRO AND NUCLEAR POWER CO., LTD. | 2
| 2009
|
Inventor Addresses
| Address | Duration |
|---|---|
| Daejeon, KR | Apr 01, 10 - Dec 25, 12 |
| Icheon-si Gyeonggi-do, KR | Nov 17, 16 - May 16, 24 |
| Icheon-si, KR | Sep 08, 16 - Dec 03, 24 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 2 |
| G06G: | ANALOGUE COMPUTERS | 1 |
| G11C: | STATIC STORES | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 12159681 | 2024 | Test systems configured to perform test mode operations for multiple memory devices | 0 |
| 2024/0161,851 | 2024 | TEST SYSTEMS CONFIGURED TO PERFORM TEST MODE OPERATIONS FOR MULTIPLE MEMORY DEVICES | 0 |
| 10060969 | 2018 | Test board unit and apparatus for testing a semiconductor chip including the same | 0 |
| 9714977 | 2017 | Burn-in test system and method | 1 |
| 2016/0334,462 | 2016 | BURN-IN TEST SYSTEM AND METHOD | 3 |
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