Sunhong JUN

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Inventor Addresses

AddressDuration
Seongnam-si, KRJan 12, 23 - Mar 05, 24
Suwon-si, KRJun 11, 20 - Mar 06, 25

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 1
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 2
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 6

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2025/0076,1162025OPTICAL MODULE, SPECTROSCOPIC DEVICE FOR HYPERSPECTRAL IMAGING, AND IMAGING MEASUREMENT METHOD USING THE SAME0
2025/0003,7342025MATERIAL MEASUREMENT SYSTEM AND METHOD0
2024/0295,4902024MEASUREMENT APPARATUS AND MEASUREMENT METHOD USING THE SAME0
2024/0255,4392024DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD0
2024/0234,2162024METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER0

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