Sunhong JUN
Inventor
Stats
- 0 US patents issued
- 9 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 0 US Patents Issued
- 9 US Applications Filed
- 1 Total Citation Count
- Apr 18, 2024 Most Recent Filing
- Sep 10, 2019 Earliest Filing
Work History
No Work History Available.Inventor Addresses
Address | Duration |
---|---|
Seongnam-si, KR | Jan 12, 23 - Mar 05, 24 |
Suwon-si, KR | Jun 11, 20 - Mar 06, 25 |
Technology Profile
Technology | Matters | |
---|---|---|
G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 1 |
G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 2 |
G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 6 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
2025/0076,116 | 2025 | OPTICAL MODULE, SPECTROSCOPIC DEVICE FOR HYPERSPECTRAL IMAGING, AND IMAGING MEASUREMENT METHOD USING THE SAME | 0 |
2025/0003,734 | 2025 | MATERIAL MEASUREMENT SYSTEM AND METHOD | 0 |
2024/0295,490 | 2024 | MEASUREMENT APPARATUS AND MEASUREMENT METHOD USING THE SAME | 0 |
2024/0255,439 | 2024 | DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD | 0 |
2024/0234,216 | 2024 | METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER | 0 |
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