Earl Jensen
Inventor
Stats
- 13 US patents issued
- 24 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 13 US Patents Issued
- 24 US Applications Filed
- 194 Total Citation Count
- Feb 6, 2024 Most Recent Filing
- Nov 19, 2003 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
KLA-TENCOR CORPORATION | 1
2 2 6 3 7 2 1 1 | 2009
2010 2011 2012 2013 2014 2015 2016 2017 |
SENSARRAY CORPORATION | 2
1 | 2003
2005 |
Inventor Addresses
Address | Duration |
---|---|
Milpitas, CA, US | May 19, 16 - Oct 29, 19 |
San Clara, CA, US | Jul 21, 11 - Jul 21, 11 |
San Jose, CA | Dec 12, 06 - Dec 19, 06 |
San Jose, CA, US | Aug 12, 04 - Aug 12, 04 |
Santa Clara, CA | Apr 05, 16 - Apr 05, 16 |
Santa Clara, CA, US | Mar 31, 11 - Mar 13, 25 |
Technology Profile
Technology | Matters | |
---|---|---|
B82Y: | SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES | 1 |
C23F: | NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACES | 1 |
G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 3 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
2025/0087,450 | 2025 | Optics for In-Situ Scanning Electron Microscope Repair | 0 |
2024/0274,401 | 2024 | SUBSTRATE POSITION MONITORING DEVICES | 0 |
11823925 | 2023 | Encapsulated instrumented substrate apparatus for acquiring measurement parameters in high temperature process applications | 0 |
11668601 | 2023 | Instrumented substrate apparatus | 0 |
2022/0189,803 | 2022 | SENSOR CONFIGURATION FOR PROCESS CONDITION MEASURING DEVICES | 0 |
We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
>
Upgrade to our Level for up to -1 portfolios!.