Earl Jensen

Inventor

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Details

Work History

Patent OwnerApplications FiledYear
KLA-TENCOR CORPORATION
1
2
2
6
3
7
2
1
1
2009
2010
2011
2012
2013
2014
2015
2016
2017
SENSARRAY CORPORATION
2
1
2003
2005

Inventor Addresses

AddressDuration
Milpitas, CA, USMay 19, 16 - Oct 29, 19
San Clara, CA, USJul 21, 11 - Jul 21, 11
San Jose, CADec 12, 06 - Dec 19, 06
San Jose, CA, USAug 12, 04 - Aug 12, 04
Santa Clara, CAApr 05, 16 - Apr 05, 16
Santa Clara, CA, USMar 31, 11 - Mar 13, 25

Technology Profile

Technology Matters
B82Y: SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES 1
C23F: NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACES 1
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 3

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2025/0087,4502025Optics for In-Situ Scanning Electron Microscope Repair0
2024/0274,4012024SUBSTRATE POSITION MONITORING DEVICES0
118239252023Encapsulated instrumented substrate apparatus for acquiring measurement parameters in high temperature process applications0
116686012023Instrumented substrate apparatus0
2022/0189,8032022SENSOR CONFIGURATION FOR PROCESS CONDITION MEASURING DEVICES0

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