Jack Jau
Inventor
Stats
- 35 US patents issued
- 55 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 35 US Patents Issued
- 55 US Applications Filed
- 444 Total Citation Count
- Feb 14, 2022 Most Recent Filing
- Nov 21, 2002 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
AIRBUS OPERATIONS GMBH | 2
| 2009
|
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. | 1
1 | 2003
2005 |
HERMES-MICROVISION (TAIWAN) INC. | 2
2 2 | 2002
2004 2006 |
HERMES MICROVISION, INC. | 2
12 12 2 10 1 7 12 1 2 | 2004
2008 2009 2010 2011 2012 2013 2014 2015 2016 |
Inventor Addresses
Address | Duration |
---|---|
Baoshan Shiang, TW | May 31, 07 - May 31, 07 |
Hsin-chu, TW | Nov 11, 04 - Nov 11, 04 |
LOS ALTOS HILLS, CA, US | Jun 10, 10 - Aug 08, 13 |
Los Alto, CA, US | May 14, 09 - May 14, 09 |
Los Altos Hills, CA | Oct 30, 08 - Oct 30, 08 |
Los Altos Hills, CA, US | Mar 25, 10 - Aug 30, 22 |
Los Altos, CA | Nov 09, 04 - Oct 19, 06 |
Los Altos, CA, US | Jul 24, 03 - Nov 03, 15 |
Technology Profile
Technology | Matters | |
---|---|---|
A61N: | ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY | 1 |
G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 2 |
G01K: | MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
11430631 | 2022 | Methods of inspecting samples with multiple beams of charged particles | 0 |
2022/0245,780 | 2022 | INSPECTION METHOD AND SYSTEM | 0 |
11250559 | 2022 | Inspection method and system | 0 |
11217423 | 2022 | Apparatus of plural charged-particle beams | 1 |
11043356 | 2021 | Local alignment point calibration method in die inspection | 0 |
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