Jack Jau

Inventor

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Work History

Patent OwnerApplications FiledYear
AIRBUS OPERATIONS GMBH
2
2009
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
1
1
2003
2005
HERMES-MICROVISION (TAIWAN) INC.
2
2
2
2002
2004
2006
HERMES MICROVISION, INC.
2
12
12
2
10
1
7
12
1
2
2004
2008
2009
2010
2011
2012
2013
2014
2015
2016

Inventor Addresses

AddressDuration
Baoshan Shiang, TWMay 31, 07 - May 31, 07
Hsin-chu, TWNov 11, 04 - Nov 11, 04
LOS ALTOS HILLS, CA, USJun 10, 10 - Aug 08, 13
Los Alto, CA, USMay 14, 09 - May 14, 09
Los Altos Hills, CAOct 30, 08 - Oct 30, 08
Los Altos Hills, CA, USMar 25, 10 - Aug 30, 22
Los Altos, CANov 09, 04 - Oct 19, 06
Los Altos, CA, USJul 24, 03 - Nov 03, 15

Technology Profile

Technology Matters
A61N: ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY 1
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 2
G01K: MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
114306312022Methods of inspecting samples with multiple beams of charged particles0
2022/0245,7802022INSPECTION METHOD AND SYSTEM0
112505592022Inspection method and system0
112174232022Apparatus of plural charged-particle beams1
110433562021Local alignment point calibration method in die inspection0

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