PALKESH JAIN

Inventor

Add to Portfolio

Stats

Details

Work History

Patent OwnerApplications FiledYear
QUALCOMM INCORPORATED
2
9
2015
2016
TEXAS INSTRUMENTS INCORPORATED
2
4
5
5
1
4
1
2006
2007
2009
2010
2011
2012
2013
REGENTS OF THE UNIVERSITY OF MINNESOTA
2
2014

Inventor Addresses

AddressDuration
BANGALORE, INApr 07, 11 - Jul 26, 18
Bangalore, INMay 21, 09 - Apr 03, 25
Karnataka, INJul 06, 10 - Sep 07, 10

Technology Profile

Technology Matters
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 9
G06F: ELECTRIC DIGITAL DATA PROCESSING 23

See more…

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2025/0110,1742025APPARATUS AND METHODS FOR THERMAL TESTING WITHIN ELECTRONIC COMPONENT ASSEMBLIES0
114246212022Configurable redundant systems for safety critical applications1
114160492022In-field monitoring of on-chip thermal, power distribution network, and power grid reliability0
2021/0234,3762021CONFIGURABLE REDUNDANT SYSTEMS FOR SAFETY CRITICAL APPLICATIONS1
109010202021Digital duty-cycle monitoring of a periodic signal1

See more…


We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
> Upgrade to our Level for up to -1 portfolios!.