Bernd Irmer
Inventor
Stats
- 4 US patents issued
- 5 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 4 US Patents Issued
- 5 US Applications Filed
- 9 Total Citation Count
- Nov 13, 2018 Most Recent Filing
- Sep 30, 2009 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
CARL ZEISS MICROSCOPY GMBH | 2
2 | 2009
2012 |
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES | 2
| 2013
|
NANOWORLD AG | 2
| 2009
|
NANOTOOLS GMBH | 2
2 2 | 2009
2012 2013 |
Inventor Addresses
Address | Duration |
---|---|
München, DE | Jun 26, 12 - Jun 26, 12 |
Muenchen, DE | Apr 01, 10 - Oct 14, 21 |
Munchen, DE | Apr 15, 10 - Apr 15, 10 |
Munich, DE | Apr 24, 12 - Oct 25, 22 |
Technology Profile
Technology | Matters | |
---|---|---|
B23P: | OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS | 1 |
C23C: | COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL | 1 |
G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
11480588 | 2022 | Method for providing a probe device for scanning probe microscopy | 0 |
2021/0318,351 | 2021 | METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY | 0 |
2020/0341,028 | 2020 | METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY | 0 |
8739310 | 2014 | Characterization structure for an atomic force microscope tip | 2 |
8723138 | 2014 | Electron beam source and method of manufacturing the same | 0 |
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