Sung-Eun Hong
Inventor
Stats
- 24 US patents issued
- 28 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 24 US Patents Issued
- 28 US Applications Filed
- 186 Total Citation Count
- Aug 10, 2010 Most Recent Filing
- Oct 7, 1999 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
MERCK PATENT GMBH | 1
2 | 2003
2004 |
DONGJIN SEMICHEM CO., LTD. | 1
| 2000
|
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY | 2
| 2006
|
HYNIX SEMICONDUCTOR INC. | 5
1 | 2001
2002 |
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. | 1
8 1 5 1 | 1999
2000 2001 2002 2003 |
Inventor Addresses
Address | Duration |
---|---|
Gyunggi-Do, KR | May 13, 03 - Aug 26, 03 |
Gyunggi-do, KR | Oct 30, 01 - Aug 24, 04 |
Kakegawa, JP | Feb 26, 08 - Feb 26, 08 |
Ogasa-gun, JP | Dec 23, 10 - Dec 23, 10 |
Scongnam-shi, KR | Aug 05, 03 - Aug 05, 03 |
Seongnam-shi, KR | Feb 26, 02 - Oct 18, 05 |
Seoul, KR | Jun 14, 07 - Feb 15, 11 |
Shizuoka, JP | Oct 06, 05 - Sep 21, 10 |
Somerville, NJ, US | May 13, 10 - May 13, 10 |
Technology Profile
Technology | Matters | |
---|---|---|
B05D: | PROCESSES FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL | 3 |
B32B: | LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM | 1 |
C01B: | NON-METALLIC ELEMENTS; COMPOUNDS THEREOF | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
7887772 | 2011 | Ultrafine porous graphitic carbon fiber and preparation method thereof | 2 |
2010/0324,330 | 2010 | Process for Preventing Development Defect and Composition for Use in the Same | 0 |
7799513 | 2010 | Process for preventing development defect and composition for use in the same | 1 |
2010/0119,717 | 2010 | WATER-SOLUBLE RESIN COMPOSITION FOR THE FORMATION OF MICROPATTERNS AND METHOD FOR THE FORMATION OF MICROPATTERNS WITH THE SAME | 16 |
7335464 | 2008 | Water soluble resin composition, method of pattern formation and method of inspecting resist pattern | 5 |
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