Eng Keong Ho

Inventor

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Work History

Patent OwnerApplications FiledYear
Systems on Silicon Manufacturing Co. Pte. Ltd.
1
2
2
2
2003
2005
2007
2011

Inventor Addresses

AddressDuration
Ang Mo Kio, SGJul 12, 07 - Jul 15, 08
Singapore, SGJul 20, 06 - Oct 22, 13

Technology Profile

Technology Matters
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2
G06F: ELECTRIC DIGITAL DATA PROCESSING 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
85640432013EEPROM cell structure and a method of fabricating the same0
2012/0181,5942012EEPROM CELL STRUCTURE AND A METHOD OF FABRICATING THE SAME0
74003912008System and method for detection of spatial signature yield loss0
2007/0161,1322007System and Method for Detection of Spatial Signature Yield Loss0
72114502007System and method for detection of spatial signature yield loss0

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