Paul Herman Heydron

Inventor

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Work History

Patent OwnerApplications FiledYear
FLUKE CORPORATION
4
2013
FLUKE CORPORATION
1
2010

Inventor Addresses

AddressDuration
Everett, WA, USFeb 06, 14 - Oct 09, 18

Technology Profile

Technology Matters
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 3
G06F: ELECTRIC DIGITAL DATA PROCESSING 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
100956592018Handheld devices, systems, and methods for measuring parameters3
97662702017Wireless test measurement7
2015/0185,2512015WIRELESS TEST MEASUREMENT28
88036982014Removable stand alone vibration monitor with automatically configured alarm thresholds11
2014/0035,6072014Handheld Devices, Systems, and Methods for Measuring Parameters27

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