Alexander Henstra

Inventor

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Details

Work History

Patent OwnerApplications FiledYear
FEI COMPANY
2
3
2
1
2
4
2
4
4
2
2
2
3
1995
1997
1998
1999
2005
2006
2009
2010
2011
2012
2013
2014
2016
KONINKLIJKE PHILIPS ELECTRONICS N.V.
1
1999
PHILIPS ELECTRON OPTICS B.V.
1
1999

Inventor Addresses

AddressDuration
Eindhoven, NLApr 23, 96 - Feb 04, 25
Hillsboro, OR, USJun 13, 19 - Oct 31, 23
Utrecht, NLNov 27, 08 - Apr 03, 25

Technology Profile

Technology Matters
C23C: COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL 1
C23F: NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACES 1
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2025/0112,0162025ABERRATION CORRECTION SYSTEMS AND CHARGED PARTICLE MICROSCOPE SYSTEMS INCLUDING THE SAME0
2025/0112,0182025ABERRATION CORRECTION SYSTEMS AND CHARGED PARTICLE MICROSCOPE SYSTEMS INCLUDING THE SAME0
2025/0112,0192025MULTIPOLE ELEMENTS AND CHARGED PARTICLE MICROSCOPE SYSTEMS INCLUDING THE SAME0
122160682025Bifocal electron microscope0
2025/0029,8092025FIB AND SEM RESOLUTION ENHANCEMENT USING ASYMMETRIC PROBE DECONVOLUTION0

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