Richard Dean Henderson

Inventor

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Work History

Patent OwnerApplications FiledYear
National Semiconductor Corporation
4
2
2002
2009
TEXAS INSTRUMENTS INCORPORATED
2
2013

Inventor Addresses

AddressDuration
San Jose, CA, USNov 02, 10 - Jul 31, 18
Sunnyvale, CAOct 28, 03 - Oct 26, 04

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 2
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 2
G01K: MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 2

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
100366562018Position detecting system based on inductive sensing0
2017/0038,2272017Position Detecting System0
94791342016Position detecting system3
2014/0247,0402014Position Detecting System22
78258382010Capacitor rotation method for removing gain error in sigma-delta analog-to-digital converters26

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