John Gumpher
Inventor
Stats
- 9 US patents issued
- 9 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 9 US Patents Issued
- 9 US Applications Filed
- 166 Total Citation Count
- May 7, 2013 Most Recent Filing
- Mar 31, 2004 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
TEL EPION INC. | 2
2 2 4 | 2010
2011 2012 2013 |
TOKYO ELECTRON LIMITED | 2
2 2 1 | 2004
2005 2007 2010 |
Inventor Addresses
Address | Duration |
---|---|
Cedar Park, TX | - |
Cedar Park, TX, US | Sep 11, 12 - Sep 11, 12 |
McKinney, TX | Oct 06, 05 - Apr 05, 07 |
McKinney, TX, US | Mar 03, 09 - Mar 03, 09 |
Mckinney, TX, US | Oct 20, 09 - Oct 20, 09 |
Niskayuna, NY, US | May 19, 11 - Apr 29, 14 |
Technology Profile
Technology | Matters | |
---|---|---|
B32B: | LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM | 1 |
C23C: | COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL | 1 |
H01L: | SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR | 8 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
8709944 | 2014 | Method to alter silicide properties using GCIB treatment | 1 |
8703607 | 2014 | Method to alter silicide properties using GCIB treatment | 0 |
2013/0230,984 | 2013 | METHOD TO ALTER SILICIDE PROPERTIES USING GCIB TREATMENT | 1 |
2013/0224,950 | 2013 | METHOD TO ALTER SILICIDE PROPERTIES USING GCIB TREATMENT | 2 |
8466045 | 2013 | Method of forming strained epitaxial carbon-doped silicon films | 3 |
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