Terry Grunzke

Inventor

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Work History

Patent OwnerApplications FiledYear
INTEL CORPORATION
2
2
2
2011
2014
2016
MICRON TECHNOLOGY, INC.
2
4
2
2
5
4
4
2
2008
2010
2011
2012
2013
2014
2016
2017

Inventor Addresses

AddressDuration
Boise, ID, USOct 08, 09 - Feb 25, 25

Technology Profile

Technology Matters
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2
G06F: ELECTRIC DIGITAL DATA PROCESSING 17
G11C: STATIC STORES 25

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
122357602025Apparatus having selectively-activated termination circuitry0
2025/0045,2032025SELECTIVELY-ACTIVATED TERMINATION CIRCUITRY, AND ASSOCIATED SYSTEMS, METHODS, AND DEVICES0
2023/0016,4152023APPARATUS HAVING SELECTIVELY-ACTIVATED TERMINATION CIRCUITRY0
113793662022Memory devices having selectively-activated termination devices0
112389492022Memory devices configured to test data path integrity0

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