Christopher F Graf

Inventor

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Work History

Patent OwnerApplications FiledYear
NATIONAL INSTRUMENTS CORPORATION
2
10
6
2011
2012
2014

Inventor Addresses

AddressDuration
Liberty Hill, TX, USJan 31, 13 - Jan 30, 18

Technology Profile

Technology Matters
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1
G06F: ELECTRIC DIGITAL DATA PROCESSING 9

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
98800302018Extending programmable measurement device functionality1
94833042016Interface wires for a measurement system diagram0
91351312015Customizing operation of a test instrument based on information from a system under test1
89387162015Synchronization modules for programmable hardware and use2
89249492014Synchronization modules for performing synchronization of programmable hardware elements1

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