Vivek K Goyal

Inventor

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Work History

Patent OwnerApplications FiledYear
MASSACHUSETTS INSTITUTE OF TECHNOLOGY
4
10
2009
2012
ALCATEL-LUCENT USA INC.
5
2
1998
2000
THE GENERAL HOSPITAL CORPORATION
3
2
2
2009
2011
2012
National Institutes of Health (NIH), U.S. Dept. of Health and Human Services (DHHS), The United States of America NIH Division of Extramural Inventions and Technology Resources (DEITR)
2
2012
SIEMENS HEALTHCARE GMBH
2
4
2011
2012
WSOU INVESTMENTS, LLC
5
1
2
1998
1999
2000
LUCENT TECHNOLOGIES INC.
1
1
1999
2000

Inventor Addresses

AddressDuration
BERKELEY, CA, USAug 23, 01 - Aug 23, 01
Berkeley, CAFeb 05, 02 - Feb 05, 02
Cambridge, MA, USOct 15, 09 - Sep 12, 17
HUDSON COUNTY, NJ, USAug 23, 01 - Aug 23, 01
Hoboken, NJMar 06, 01 - Jan 31, 06

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 1
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1
G01L: MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
97599952017System and method for diffuse imaging with time-varying illumination intensity0
95941412017System for accelerated magnetic resonance imaging using parallel coils2
95882072017System for reconstructing MRI images acquired in parallel7
92941132016Energy-efficient time-stampless adaptive nonuniform sampling10
89823632015Method and apparatus to determine depth information for a scene of interest4

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