Paul Gerard Gladnick

Inventor

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Work History

Patent OwnerApplications FiledYear
MITUTOYO CORPORATION
3
8
2
2
1
2010
2013
2014
2015
2016

Inventor Addresses

AddressDuration
Seatle, WA, USNov 10, 15 - Nov 10, 15
Seattle, WA, USDec 29, 11 - Mar 04, 25
Seattlle, WA, USJun 01, 23 - Aug 01, 23

Technology Profile

Technology Matters
C09K: MATERIALS FOR APPLICATIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR 1
F21V: FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR 2
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 5

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
122420472025Metrology system utilizing annular optical configuration0
122042262025Metrology system configured to illuminate and measure apertures of workpieces0
2025/0004,2632025METROLOGY SYSTEM UTILIZING ANNULAR OPTICAL CONFIGURATION0
2024/0393,6572024METROLOGY SYSTEM CONFIGURED TO ILLUMINATE AND MEASURE APERTURES OF WORKPIECES0
117140512023Metrology system configured to measure apertures of workpieces0

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