Paul Gerard Gladnick
Inventor
Stats
- 9 US patents issued
- 25 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 9 US Patents Issued
- 25 US Applications Filed
- 199 Total Citation Count
- Jun 29, 2023 Most Recent Filing
- Nov 10, 2010 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
MITUTOYO CORPORATION | 3
8 2 2 1 | 2010
2013 2014 2015 2016 |
Inventor Addresses
Address | Duration |
---|---|
Seatle, WA, US | Nov 10, 15 - Nov 10, 15 |
Seattle, WA, US | Dec 29, 11 - Mar 04, 25 |
Seattlle, WA, US | Jun 01, 23 - Aug 01, 23 |
Technology Profile
Technology | Matters | |
---|---|---|
C09K: | MATERIALS FOR APPLICATIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR | 1 |
F21V: | FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR | 2 |
G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 5 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
12242047 | 2025 | Metrology system utilizing annular optical configuration | 0 |
12204226 | 2025 | Metrology system configured to illuminate and measure apertures of workpieces | 0 |
2025/0004,263 | 2025 | METROLOGY SYSTEM UTILIZING ANNULAR OPTICAL CONFIGURATION | 0 |
2024/0393,657 | 2024 | METROLOGY SYSTEM CONFIGURED TO ILLUMINATE AND MEASURE APERTURES OF WORKPIECES | 0 |
11714051 | 2023 | Metrology system configured to measure apertures of workpieces | 0 |
We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
>
Upgrade to our Level for up to -1 portfolios!.