Philipp Henning Gerlach

Inventor

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Work History

Patent OwnerApplications FiledYear
KONINKLIJKE PHILIPS ELECTRONICS N V
2
4
1
2009
2010
2012
KONINKLIJKE PHILIPS ELECTRONICS N.V.
2
2009
KONINKLIJKE PHILIPS N.V.
1
2
1
2
1
2012
2013
2014
2015
2016

Inventor Addresses

AddressDuration
Aachen, DEMay 21, 15 - Apr 18, 17
Blaustein, DEMar 17, 11 - Dec 17, 13
EINDHOVEN, NLMar 15, 18 - Feb 21, 19
Eindhoven, DEDec 26, 13 - Nov 18, 14
Eindhoven, NLNov 13, 18 - May 19, 20
ULM, DESep 01, 16 - Feb 14, 19
Ulm, DEMay 24, 12 - Jan 07, 25

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 1
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
121916302025Vertical cavity surface emitting laser device with monolithically integrated photodiode0
120554752024Method of reducing false-positive particle counts of an interference particle sensor module0
120342722024Vertical cavity surface emitting laser device with integrated photodiode0
120152402024Laser device and method of determining a malfunction of a laser diode0
119733202024VCSEL device for an SMI sensor for recording three-dimensional pictures0

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