Malay Ganai

Inventor

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Work History

Patent OwnerApplications FiledYear
NEC LABORATORIES AMERICA, INC.
1
1
2
1
1
1
2009
2010
2011
2012
2013
2014
NEC CORPORATION
2
4
3
3
4
4
2
2002
2004
2005
2006
2007
2008
2012
SYNOPSYS, INC.
2
2015

Inventor Addresses

AddressDuration
USOct 21, 04 - Oct 21, 04
PLAINSBORO, NJSep 27, 07 - Sep 27, 07
PLAINSBORO, NJ, USJan 14, 10 - Oct 06, 11
PRINCETON, NJ, USJun 14, 12 - Jul 05, 12
Plainsboro, NJDec 04, 03 - Jun 10, 08
Plainsboro, NJ, USJul 28, 05 - Mar 19, 15
Princeton, NJ, USApr 22, 14 - Apr 22, 14
San Jose, CA, USSep 08, 16 - Jan 30, 25
USNov 18, 04 - Nov 18, 04

Technology Profile

Technology Matters
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1
G06F: ELECTRIC DIGITAL DATA PROCESSING 19
G06G: ANALOGUE COMPUTERS 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2025/0035,6972025BIAS CAUSE REDUCTION FOR LOCALIZING CONSTRAINTS0
97210572017System and method for netlist clock domain crossing verification1
2016/0259,8792016SYSTEM AND METHOD FOR NETLIST CLOCK DOMAIN CROSSING VERIFICATION6
2015/0081,2432015Setsudo: Pertubation-based Testing Framework for Scalable Distributed Systems27
87072722014Scenario driven concurrency bugs: model and check4

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