Lionel Jacques Garin

Inventor

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Work History

Patent OwnerApplications FiledYear
PANASONIC ELECTRIC WORKS CO., LTD.
2
1
2
2001
2002
2005
QUALCOMM INCORPORATED
2
5
14
27
13
11
12
2009
2011
2012
2013
2014
2015
2016
SIRF TECHNOLOGY HOLDINGS, INC.
1
1
2002
2003
SiRF Technology, Inc. and Matsushita Electric Works, Ltd.
1
2002
SAMSUNG ELECTRONICS CO., LTD.
2
6
2
2
2
2001
2002
2003
2004
2005
PANASONIC CORPORATION
2
2008
CSR LIMITED
2
2003
CSR TECHNOLOGY INC.
1
2
4
7
3
4
2
3
2
3
2
2
2000
2001
2002
2003
2004
2005
2006
2007
2008
2010
2011
2012

Inventor Addresses

AddressDuration
Palo Alto, CAMay 14, 02 - Jul 31, 08
Palo Alto, CA, USJul 04, 02 - Dec 10, 19

Technology Profile

Technology Matters
G01C: MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY 31
G01L: MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE 2
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
105028402019Outlier detection for satellite positioning system using visual inertial odometry6
104957632019Mobile platform positioning using satellite positioning system and visual-inertial odometry5
103307922019Repair of carrier-phase cycle slips using displacement data1
103241952019Visual inertial odometry attitude drift calibration8
102746072019Fast recovery from incorrect carrier phase integer locking1

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