Kentaro Fujiyoshi

Inventor

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Work History

Patent OwnerApplications FiledYear
E. I. DU PONT DE NEMOURS AND COMPANY
2
2013
CANON KABUSHIKI KAISHA
2
16
16
17
5
21
10
2010
2011
2012
2013
2014
2015
2016

Inventor Addresses

AddressDuration
Irvine, CA, USMar 10, 22 - Nov 14, 23
Kumagaya, JPMar 26, 13 - Feb 23, 16
Kumagaya-shi, JPJun 09, 11 - Jan 16, 14
Tokyo, JPOct 10, 13 - Nov 12, 24

Technology Profile

Technology Matters
A61B: DIAGNOSIS; SURGERY; IDENTIFICATION 20
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1
G01G: WEIGHING 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
121407162024Apparatus and system0
2024/0019,5952024RADIATION IMAGING APPARATUS0
118156372023Radiation imaging apparatus0
118156352023Radiographic apparatus and radiographic system0
117891652023Radiation imaging apparatus and radiation imaging system0

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