Taisuke Fujita

Inventor

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Work History

Patent OwnerApplications FiledYear
Asahi Kasei Microdevices Corporation
5
2013

Inventor Addresses

AddressDuration
Tokyo, JPSep 26, 13 - Feb 18, 25

Technology Profile

Technology Matters
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1
G01K: MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
122294852025Assist apparatus, design assist method, design assist system, and computer readable medium0
2022/0171,9092022ASSIST APPARATUS, DESIGN ASSIST METHOD, DESIGN ASSIST SYSTEM, AND COMPUTER READABLE MEDIUM1
98640382018Hall electromotive force compensation device and hall electromotive force compensation method5
91343832015Hall device, magnetic sensor having same, and signal correcting method thereof3
2015/0115,9372015HALL ELECTROMOTIVE FORCE COMPENSATION DEVICE AND HALL ELECTROMOTIVE FORCE COMPENSATION METHOD13

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