Juergen Frosien

Inventor

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Work History

Patent OwnerApplications FiledYear
ADVANTEST CORPORATION
1
1
1
1
2
1
1981
1984
1985
1986
1987
1989
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnick mbH
1
2008
JEOL LTD.
2
2
2005
2008
SIEMENS AKTIENGESELLSCHAFT
1
1
1
1
1979
1980
1985
1986
JEOL, Inc.
1
2008
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
1
6
6
4
10
13
2
2
1987
2004
2005
2006
2007
2008
2009
2010
APPLIED MATERIALS, INC.
1
1
4
2
1985
1987
2005
2006
APPLIED MATERIALS ISRAEL, LTD.
2
1
2
1
2005
2008
2013
2015
CARL ZEISS AG
1
2008

Inventor Addresses

AddressDuration
Berlin, DEDec 09, 80 - Jul 12, 83
Kufsteinerstr, DENov 16, 06 - Nov 16, 06
Kufsteinerstrasse 16ASep 21, 10 - Sep 21, 10
Ottobrunn, DEApr 30, 85 - Jan 15, 91
Reimerling, DEApr 05, 07 - Apr 07, 09
Riemerling, DEJul 13, 06 - Jan 08, 19

Technology Profile

Technology Matters
A61N: ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY 3
B01D: SEPARATION 1
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
101770482019System for inspecting and reviewing a sample1
2016/0260,6422016SYSTEM FOR INSPECTING AND REVIEWING A SAMPLE1
92976922016System and method for inspecting a sample using landing lens0
91534132015Multi-beam scanning electron beam device and methods of using the same29
2014/0231,6322014SYSTEM AND METHOD FOR INSPECTING A SAMPLE USING LANDING LENS0

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