Juergen Frosien
Inventor
Stats
- 42 US patents issued
- 46 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 42 US Patents Issued
- 46 US Applications Filed
- 674 Total Citation Count
- Mar 4, 2015 Most Recent Filing
- May 17, 1979 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
ADVANTEST CORPORATION | 1
1 1 1 2 1 | 1981
1984 1985 1986 1987 1989 |
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnick mbH | 1
| 2008
|
JEOL LTD. | 2
2 | 2005
2008 |
SIEMENS AKTIENGESELLSCHAFT | 1
1 1 1 | 1979
1980 1985 1986 |
JEOL, Inc. | 1
| 2008
|
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | 1
6 6 4 10 13 2 2 | 1987
2004 2005 2006 2007 2008 2009 2010 |
APPLIED MATERIALS, INC. | 1
1 4 2 | 1985
1987 2005 2006 |
APPLIED MATERIALS ISRAEL, LTD. | 2
1 2 1 | 2005
2008 2013 2015 |
CARL ZEISS AG | 1
| 2008
|
Inventor Addresses
Address | Duration |
---|---|
Berlin, DE | Dec 09, 80 - Jul 12, 83 |
Kufsteinerstr, DE | Nov 16, 06 - Nov 16, 06 |
Kufsteinerstrasse 16A | Sep 21, 10 - Sep 21, 10 |
Ottobrunn, DE | Apr 30, 85 - Jan 15, 91 |
Reimerling, DE | Apr 05, 07 - Apr 07, 09 |
Riemerling, DE | Jul 13, 06 - Jan 08, 19 |
Technology Profile
Technology | Matters | |
---|---|---|
A61N: | ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY | 3 |
B01D: | SEPARATION | 1 |
G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
10177048 | 2019 | System for inspecting and reviewing a sample | 1 |
2016/0260,642 | 2016 | SYSTEM FOR INSPECTING AND REVIEWING A SAMPLE | 1 |
9297692 | 2016 | System and method for inspecting a sample using landing lens | 0 |
9153413 | 2015 | Multi-beam scanning electron beam device and methods of using the same | 29 |
2014/0231,632 | 2014 | SYSTEM AND METHOD FOR INSPECTING A SAMPLE USING LANDING LENS | 0 |
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