David L Freeman

Inventor

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Work History

Patent OwnerApplications FiledYear
BENCHMARQ CONTROLS, INC., A CORP. OF DELAWARE
1
1990
MEESPIERSON N.V.
1
1987
TEXAS INSTRUMENTS INCORPORATED
6
4
2003
2011
Benchmarg Microelectronics, Inc.
1
3
2
1990
1992
1994
Canadian General Electric Company Limited
1
1979
WESTERN ATLAS INTERNATIONAL, INC.
1
1982
CORE LABORATORIES LP
1
1982
PHOTON DYNAMICS, INC.
2
2002
Microlytics, Inc.
1
1987

Inventor Addresses

AddressDuration
Bridgenorth, CADec 09, 80 - Dec 09, 80
Garland, TXDec 03, 85 - Jun 13, 89
Los Gatos, CAFeb 12, 08 - Feb 12, 08
Los Gatos, CA, USFeb 19, 04 - Feb 19, 04
McKinley, TXSep 07, 04 - May 10, 05
McKinley, TX, USJul 01, 04 - Nov 04, 04
McKinney, TX, USJun 13, 13 - Nov 05, 13
Plano, TXFeb 08, 94 - Aug 20, 96
Rt. 1, Box 373-5, Sperry, OK 74073Aug 15, 89 - Aug 15, 89

Technology Profile

Technology Matters
B25B: TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING, OR HOLDING 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 3
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 6

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
85758452013Method and apparatus to measure light intensity1
85700122013Diode for use in a switched mode power supply1
2013/0154,4832013METHOD AND APPARATUS TO MEASURE LIGHT INTENSITY3
2013/0146,8872013DIODE FOR USE IN A SWITCHED MODE POWER SUPPLY0
73305832008Integrated visual imaging and electronic sensing inspection systems4

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