Emmanuel Fort
Inventor
Stats
- 2 US patents issued
- 6 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 2 US Patents Issued
- 6 US Applications Filed
- 6 Total Citation Count
- Jul 11, 2017 Most Recent Filing
- Mar 2, 2006 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| NEXDOT | 2
| 2006
|
| CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE | 1
2 1 1 | 2006
2011 2015 2016 |
| UNIVERSITÉ PARIS-SUD | 1
| 2015
|
Inventor Addresses
| Address | Duration |
|---|---|
| CACHAN, FR | Sep 05, 19 - Sep 05, 19 |
| Cachan, FR | Oct 24, 13 - Aug 04, 20 |
| Paris, FR | Sep 24, 09 - Dec 21, 10 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| C12Q: | MEASURING OR TESTING PROCESSES INVOLVING ENZYMES OR MICRO-ORGANISMS | 1 |
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 1 |
| G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 10732114 | 2020 | System and method for measuring a physical parameter of a medium | 0 |
| 2019/0271,649 | 2019 | SYSTEM AND METHOD FOR MEASURING A PHYSICAL PARAMETER OF A MEDIUM | 0 |
| 10345241 | 2019 | Method of observing the emission of light from a sample by dynamic optical microscopy | 0 |
| 10012495 | 2018 | Optical telemetry device | 1 |
| 2017/0299,375 | 2017 | OPTICAL TELEMETRY DEVICE | 1 |
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