Tyler Bennett Evans

Inventor

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Work History

Patent OwnerApplications FiledYear
FLUKE CORPORATION
6
2014

Inventor Addresses

AddressDuration
Edmonds, WA, USSep 18, 14 - Dec 12, 23

Technology Profile

Technology Matters
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 6
G01M: TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR 5
G06F: ELECTRIC DIGITAL DATA PROCESSING 5

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
118439042023Automated combined display of measurement data0
2021/0033,4972021AUTOMATED COMBINED DISPLAY OF MEASUREMENT DATA2
108091592020Automated combined display of measurement data3
107884012020Remote sharing of measurement data1
100883892018Automatic recording and graphing of measurement data3

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